Revision: Published Date: January ; Status: Superseded By: Superseded By : ASME B; Document Language: Published By: ASME International (ASME). ASME B Surface Texture (Surface Roughness, Waviness, and Lay) By: ASME International (ASME); Page Count: ; ANSI Approved: Yes; DoD. ASME B Ssk. Surface Skewness. ISO /1. ASME B ISO/DIS 2. ASME B Sku. Surface Kurtosis. ANSI B ASME B ISO/DIS.

Author: Mera Akinolrajas
Country: Honduras
Language: English (Spanish)
Genre: Science
Published (Last): 2 July 2004
Pages: 120
PDF File Size: 10.88 Mb
ePub File Size: 16.50 Mb
ISBN: 473-9-67460-776-9
Downloads: 85489
Price: Free* [*Free Regsitration Required]
Uploader: Dikinos

The PSD for the ground surface points out a ubiquitous phenomenon for all but the most artificial of finished surfacesthat the power spectral density function generally increases with spatial wavelength up to wavelengths on the scale of the dimensions of the surface itself.

Whitenton b4 suggestions to clarify a number of explanations in the text.

ANSI-ASME B46.1-1985.pdf

Surfaces with very dominant directions will have Stdi values close to zero and if the amplitude sum of all direction are similar, Stdi is close to 1. That is, with respect to what curve are the peaks and valleys of the surface measured?

Assuming 85 R Figure Twyman-Green Interferometer Photo by Wyant [15] Multiple Beam Interferometer Figure 86 that the reference surface is zsme smooth and fiat, each fringe gives you a profile of the surface topography of the measured surface.

Styii are available with tip widths rated as small as 0. Then you have sources of error that we classify as calibration errors. Calibration uncertainty in step height measurements arises from the same sources already described for roughness with the exceptions that components 5 and 6 are eliminated. Figure shows the light scattering intensity pattern for a hand-lapped surface [21].

  MANUAL DE RADIOLOGIA PARA TECNICOS STEWART C.BUSHONG PDF

We highlight profiling and area techniques in Fig. We schematically represent the measurement of these scattering phenomena by the five detectors shown in Fig. Undulation of the fringes is introduced by surface roughness or form deviations on either the reference or measuring surface.

Stylus instruments produce detailed quantitative profile outputs and their ratio of range -to – resolution in both the horizontal and the lateral directions is excellent. In the optical and x-ray fields, basically the smoother the components are, the better.

Their value increases generally as the square root of the sampling length [17], and this behavior may be understood in amsi of random walk methods for analyzing surface profiles. The andi is achieved by two piezo drives, x and y, which give the capability of mapping a small area by a raster approach.

The only movement is the vertical movement of the piezo transducer over a total amplitude of approximately one-half wavelength of light.

ASME B – Surface Texture (Surface Roughness, Waviness, and Lay)

One of the potential advantages is its potential for dimensional inspection, as well as surface inspection. The light scattering pattern, as we discussed previously, is characteristic of the roughness of the surface. Asmd Texture DirectionStdis defined as the angle of the dominating texture in the image. Three- Dimensional Stylus ProfilometryWear 1 The spatial properties are described by five parameters.

A measurement of that height is determined by comparing the fringe shift at the step with the splitting of the fringes. There are three hybrid parameters. Uncertainty in either quantity causes a small amount of uncertainty in Ra, which also depends on the roughness and form of the profile.

  ATZENI BASI DI DATI ARCHITETTURE E LINEE DI EVOLUZIONE PDF

As you can see on the right, the width of the fringes themselves in relation to the basic fringe spacing is much sharper than that of the dual-beam interferometer.

Cast Microfinish Comparator

We note here that the units along the y-axis are arbitrary and that the chart should not be used to make cost comparisons between the different processes. Part 3k, The phenomenon was dramatically illustrated by Sayles and Thomas [34] who assme the PSD’s for a number of different surfaces ranging from lapped steel to the surface of the moon. Designers should consider 60 — RMS as an appropriate range of variation when specifying a surface texture requirement and also deciding if a 11 surface should be machined to a finer finish or remain as-cast.

Using these rules, they combined motifs.

Surface Texture of Investment Castings | O’Fallon Casting

Figure [41] gives an overview of the range and resolution of three of the surface profiling techniques that we have been talking about. The resolution limit of stylus instruments is approximately 0.

The magnitude of that current is extremely sensitive to the distance of the 98 Figure 1 Dynamic snsi me a su r i ng p. Scanning Tunneling Microscopy, Helv. The sensing element conductor is about 1. A schematic diagram Fig.